Outline and Introduction of Interferometry of modern optical electronic testing

Jun16

Course No:1121151
TitleInterferometry of modern optical electronic testing
Class Hours/Week:  3-1                  Credit: 2                  Category: Specialty
Prerequisites:Optical Engineering
Test and Grading Criteria 
open-book exam (70%)+usually works(30%)
Course objectives and basic requirements:
The application field of interference technology is expanding unceasingly as interference theory combining with optical-electronic information detecting techniques. It is already become one of the major measuring methods in high accurate degree testing and nano-technology. The course is designed for the graduate students to understand the Interferometry of modern optical- electronic testing and applying to information testing fields.
The students should:
1.understand the design of interference system and the pupil windows theory
2.master several the techniques of rejection noise in optical-electronic interference detecting
3.master several novel techniques of optical-electronic interference testing
4.be active in case study and discussion the course and experiment teaching
Course introduction: 
This course has introduced the application of modern optical-electronic interference testing techniques in modern national defense, industry and nano-technology field. Take actual interference systems as example, have introduced the pupil window theory of interference system and design, several novel testing techniques of optical-electronic come-path interference. Based on interference length measurement, introduced various kinds interference sensor of measuring micro-displacement, several techniques of rejection noise in optical-electronic interference detecting and optical-electronic signal processing. To introduce the vibration testing by use of interference method, heterodyne interference detection, lock-in detection and nano-technology which are closely related to interference testing.
Suggested textbooks or references:
Textbooks:
1.  Cunyong YIN. Modern Interference Test Technology.  Tianjin University Press.现代干涉测试技术            殷纯永主编 天津大学出版社