Time: 9:30-10:30am 17 Sep., 2012(Monday)
Location: Conference Room 440, the 3rd Academic Building, Yuquan Campus, Zhejiang University
Standards and Measurement of LEDs and Solid State Lighting
Abstract:
Standards for solid state lighting measurement (international and USA) will be first overviewed, including CEN/CIE draft SSL test method, CIE 127 on low power LEDs, IES LM-79 for LED lamps and luminaires, LM-80 and TM-21 for lumen maintenance, LM-82 for light engines, LM-85 (draft) for high power LED packages, and ANSI C78.377 on chromaticity specification.
Various measurement methods for LED components to LED luminaires will be presented based on these standards. Measurement methods include measurements of photometric quantities such as total luminous flux, luminous efficacy, luminous intensity distribution, as well as colorimetric quantities such as chromaticity x, y, u¹, v¹, correlated color temperature (CCT), Duv, and color rendering index (CRI). Some guidance on the use of integrating spheres, goniophotometers, and spectroradiometers, including various correction techniques, will also be presented.
Brief Bio:YoshiOhno is the Leader of Lighting and Colour Group in the Sensor Science Division of the National Institute of Standards and Technology Institute (NIST), USA. He has been actively involved in research pertaining to photometry and colorimetry. Specific projects of interest include integrating sphere, luminous flux measurement, colorimetry of light sources, color rendering, spectroradiometry, photometry of flashing lights, and solid state lighting.
He is a Fellow of IESNA, currently serves as the Vice President of Technology (CIE), NIST representative for CCPR, Chair of CCPR Working Group of Key Comparisons, and active in technical committees in CIE, ISO, ANSI, and IESNA.
Ohno received Arthur S. Flemming Award in 2006, CIE de Boer Gold Pin Distinguished Service Award in 2007, and U.S. Department of Commerce Silver Medal Award in 2009.